JUNE 10 - 11, 2010 The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12)
SISS-12 will cover SIMS and related techniques based on ion-solid interactions: fundamentals, instrumentation, and application in various fields, such as semiconductors, industrial materials, biological, medical, and environmental sciences. This symposium will be held as a post-conference of SIMS-XVII. In this time, we will have mainly three sessions: Atom Probe, D-SIMS, and TOF-SIMS.
Charles W. Magee, Chief Scientist, Evans Analytical Group
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