SIMS XVII Conference

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AVS Endorsed Technical Conference

SIMS XVII is being jointly organized by The University at Buffalo (New York, USA), The University of Toronto (Toronto, ON) and The University of Western Ontario (London, ON).

Discussion Day Papers

The following papers are available:

Thursday morning Discussion Day program:

PDFMolecular depth profiling with reactive ions, or why chemistry matters in sputtering

PDFCluster Secondary Ion Mass Spectrometry Of Polmyers and Related Materials

PDFUltra-shallow SIMS for semiconductor depth profiling

PDFEnergy and transition-rate dependent neutralisation of secondary ions
originating from inner-shell excitation


 

 

 


SIMS XVII Conference Secretariat: Ron Dewar - Meeting Management Services - (905) 335-7993 or (800) 625-7925 - ron@mmsonline.ca

SIMS XVII Conference Co-Chairs: Dr. Joseph Gardella, Jr., University at Buffalo gardella@buffalo.edu
Dr. Rana Sodhi
, University of Toronto Sodhi@chem-eng.utoronto.ca
Dr. Leo Lau, University of Western Ontario  llau22@uwo.ca
webmaster ellewood@roadrunner.com