Confirmed Speakers

Plenary Speakers (confirmed)

Prof. A. Benninghoven – (U. Munster)
“A history of the SIMS Conference and SIMS”

Prof. Michael Sefton website
“New New Biomaterials”

Prof. Michael Bancroft website
“The Canadian Road to See the Light - a Historical Perspective of the Development ofthe Canadian Light Source Facility”

Invited Speakers (confirmed)

Prof. Georges Slodzian (Univ. Paris SUD 11) “Phenomenological and pragmatic approaches to isotopic fractionation in negative ion emission under Cs+ bombardment.”

Dr. Christine Mahoney (NIST) Cluster ion depth profiling (Discussion Day)

Prof. John Valley and Dr. Noriko Kita (Univ. Wisc) Geological Applications

Dr. Klaus Wittmaack (German Research Center for Environmental Health) Fundamentals of depth profiling (Discussion Day)

Prof. Alain Brunelle (CNRS, Fr) Cell and Tissue applications

Prof. Laurent Houssiau (Namur) Polymer depth profiling (Discussion Day)

Prof. Antonino Licciardello (U Catania) Polymer applications

Prof. Andrew Wee (National Univ. Singapore) Depth profiling (Discussion Day)

Prof. Amy Walker (Wash U), Organic/polymer applications

Dr. Anna Belu (Medtronic) Industrial applications

Dr. Temel Büyüklimanli (Evans Analytical), Ultrashallow Depth profiling

Dr. Marie-Laure Abel (Univ. Surrey) Art Conservation

Dr. Lucille Giannuzzi (FEI) Focused Ion Beam Sources

Dr. James Ohlhausen (Sandia National Labs) Data analysis

Dr. David McPhail (Imperial College), Focused Ion Beam Sources

Prof. Zbigniew Postawa, (Jagiellonian University) Fundamentals

Drs. Martin Seah and Ian Gilmore, (NPL), Cluster Ion sources, fundamentals

Prof. Jiro Matsuo (Kyoto University) Cluster ion sources

Dr. Alexander Brennanstuhl (Ontario Power Generation Inc.) The Application of SIMS for Studying Corrosion in the Nuclear Industry