| Michael Eller |
Real-time localization of single C60 impacts with correlated secondary ion detection |
| Anastassia Filenkova |
Use of ToF-SIMS Imaging to Follow Distribution of Ink Components |
| Jennifer Fitzgerald |
Matrix Enhanced Secondary Ion Mass Spectrometry (ME SIMS) Using Ionic Liquid Matrices |
| Robyn Goacher |
Cluster Primary Ions vs. Monatomic Primary Ions: Differences in Secondary Cluster Ion Yields, Depth Resolutions, and Relative Sensitivity Factors for Inorganic Material Analysis. |
| Andreas Herrmann |
Optimisation and comparing of depth profiling in GaAs and GaSb with TOF-SIMS |
| Ingela Lanekoff |
An In Situ Fracture Device to Image Lipids in Single Cells Using ToF-SIMS |
| Yiu-Ting Richard Lau |
Study of polymer chain folding by time-of-flight secondary ion mass spectrometry |
| Libing Li |
Optimisation of FIB-SIMS by development of yield enhancement strategies |
| Prateek Maheshwari |
Surface Analysis of Nb Materials for SRF Cavities |
| Shin Muramoto |
On the way to optimal 3D molecular imaging with ToF-SIMS: A comparison between C60 single beam and Bin/C60 dual beam depth profiling |
| Chuong Nguyen |
TOF-SIMS Studies of Intercalcated Gibbsites |
| Jiwon Park |
ToF-SIMS Analysis of Myocardial Infarcted Tissue |
| Melissa Passarelli |
Lipid analysis of tissue, cell and thin films using SIMS and MALDI |
| Paul Piehowski |
Sub-Micrometer Biological Imaging with ToF-SIMS: Measuring Lipid Domains at Single Cells |
| Aneesh Prabhakaran |
Secondary Ion Yield Enhancement in organic samples due to the Au/Pt nanoparticle condensation and their substrate effects. |
| Matthieu Py |
Investigation of fullerene depth distribution in polymer-fullerene blends using ToF-SIMS |
| Oscar AntonioRestrepo Gutierrez |
Molecular dynamics study of metal-organic samples bombarded by kiloelectronvolt projectiles |
| Fouad Wahoud |
Origin of the oscillatory phase during Cs+ sputtering of organic materials |
